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ST72682 数据表(PDF) 14 Page - STMicroelectronics |
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ST72682 数据表(HTML) 14 Page - STMicroelectronics |
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14 / 36 page ![]() NAND Flash memory interface ST72682 14/36 4.2 Bad block management NAND memory manufacturers deliver their devices with factory-marked bad blocks. This marking depends on the manufacturer and the NAND memory type (page size, memory technology, etc.). The ST72682 supports all bad block markings currently available on the market. 4.2.1 Bad Block identification During firmware initialization, the MCU scans the entire NAND memory configuration to identify bad blocks. A bad block is defined as follows: ● Five different block status bytes are considered: 4 status bytes from page 0 and 1 from an other page (page 127 for MLC NAND; page 1 for SLC NAND). ● The considered block is marked as a bad block if one out of these five bytes contains at least four bits set to ‘0’. 4.2.2 Bad block replacement The firmware works on groups of 1024 blocks, called zones. A complete NAND configuration can contain several zones: ● Each zone is described in a Look Up Table (LUT) containing 1024 entries. A LUT is composed of 3 parts: used blocks, free blocks and bad blocks. ● The “bad blocks” part contains as many entries as the number of bad blocks identified in that zone. ● The “used blocks” part can have a size of 1000, 900 or 500 entries. This size is configurable and also depends on the number of identified bad blocks. ● The “free blocks” part contains the remaining entries. The used blocks part is used to do a correspondence between NAND blocks and logical address ranges. This system allows all bad blocks to be masked from the Host. As a result, bad blocks are never seen. Only a range of logical addresses are visible which correspond to the sum of the used blocks part of all zones. 4.2.3 Late Fail block During normal application life, defects may appear in the NAND memory. Under certain conditions, these defects are not correctable and the corresponding block is declared as “bad”. In this case, new bad blocks are identified in the bad blocks part of the LUT and replaced by new blocks from the “free blocks” part. |
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