F1953 Datasheet

© 2022 Renesas Electronics Corporation

16

February 9, 2022

EVKIT THROUGH-REFLECT-LINE (TRL) CALIBRATION

The “Through-Reflect-Line” (TRL) method [1] is used to de-embed the evaluation board losses from the S-

parameter measurements of the F1953. This method requires the use of three standards: a through, a reflection,

and a line. The TRL method has the advantage over other calibration methods in that it requires only one of these

three standards to be well defined.

The TRL through which is used for the F1953 TRL calibration was constructed identically to the evaluation board,

minus the DUT and its corresponding length. Therefore, the through corresponds to a precise zero length

connection between the input and output reference planes of the DUT. This through satisfies the requirement of

the TRL method that one of the three standards be precisely specified.

The TRL reflection standard used is constructed identically to the input and output lines of the evaluation board,

with a short placed at the reference plane of the DUT. In accordance with the TRL method’s requirements, the

actual magnitude and phase were not accurately specified, but the phase was known to within 90 degrees and the

TRL reflection standard has a magnitude close to one.

The TRL line standard is identical to the TRL through, but with an additional length of 0.8 inches (2cm). This

satisfies the TRL method’s requirement that the TRL be a different length than the TRL through, that it have the

same impedance and propagation constant as the through, and that the phase difference between the through and

the line be between 20 degrees and 160 degrees. The difference in length yields a phase difference of

approximately 20 degrees at 500MHz, and a phase difference of 160 degrees at 4GHz.

Standards used for F195x TRL calibration

F1953 evaluation circuit

Engen, G.F.; Hoer, C.A.; “Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network

Analyzer,” IEEE Transactions on Microwave Theory and Techniques, Volume: 27 Issue:12, pp. 987 – 993, Dec 1979.