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ST7262 数据表(PDF) 110 Page - STMicroelectronics |
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ST7262 数据表(HTML) 110 Page - STMicroelectronics |
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110 / 139 page ![]() 110/139 12.8 I/O PORT PIN CHARACTERISTICS 12.8.1 General Characteristics Subject to general operating conditions for VDD, fCPU, and TA unless otherwise specified. Figure 61. Two typical Applications with unused I/O Pin Figure 62. Typical IPU vs. VDD with VIN=VSS Figure 63. Typical RPU vs. VDD with VIN=VSS Notes: 1. Configuration not recommended, all unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or an external pull-up or pull-down resistor (see Figure 61). Static peak current value taken at a fixed VIN value, based on design simulation and technology characteristics, not tested in production. This value depends on VDD and tem- perature values. 2. The RPU pull-up equivalent resistor is based on a resistive transistor (corresponding IPU current characteristics de- scribed in Figure 62). This data is based on characterization results. 3. To generate an external interrupt, a minimum pulse width has to be applied on an I/O port pin configured as an external interrupt source. Symbol Parameter Conditions Min Typ Max Unit VIL Input low level voltage 0.3xVDD V VIH Input high level voltage 0.7xVDD VIN Input voltage True Open Drain I/O pins VSS 6.0 V Other I/O pins VDD Vhys Schmitt trigger voltage hysteresis 400 mV IL Input leakage current VSS≤VIN≤VDD ±1 µA IS Static current consumption 1) Floating input mode 400 RPU Weak pull-up equivalent resistor 2) VIN=VSS VDD=5V 50 80 150 k Ω CIO I/O pin capacitance 5 pF tf(IO)out Output high to low level fall time CL=50pF Between 10% and 90% 25 ns tr(IO)out Output low to high level rise time 25 tw(IT)in External interrupt pulse time 3) 1tCPU 10k Ω UNUSED I/O PORT ST72XXX 10k Ω UNUSED I/O PORT ST72XXX VDD -90.0 -80.0 -70.0 -60.0 -50.0 -40.0 -30.0 -20.0 -10.0 0.0 3.0 3.5 4.0 4.5 5.0 5.5 6.0 Vdd (V) 0 20 40 60 80 100 120 140 160 180 3.0 3.5 4.0 4.5 5.0 5.5 6.0 Vdd (V) |
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