LMP2234

SNOSAW4D – SEPTEMBER 2007 – REVISED MARCH 2013

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2.5V DC Electrical Characteristics

(1) (continued)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V, V

CM = VO = V

+/2, and R

L > 1MΩ.

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

CMRR

Common Mode Rejection Ratio

0V

≤ VCM ≤ 1.5V

77

91

dB

76

PSRR

Power Supply Rejection Ratio

1.6V

≤ V+ ≤ 5.5V

83

120

dB

VCM = 0V

82

CMVR

Common Mode Voltage Range

CMRR

≥ 77 dB

−0.2

1.7

V

CMRR

≥ 76 dB

−0.2

1.7

AVOL

Large Signal Voltage Gain

VO = 0.3V to 2.2V

104

120

dB

RL = 10 kΩ to V

+/2

104

VO

Output Swing High

RL = 10 kΩ to V

+/2

12

50

mV

VIN(diff) = 100 mV

50

from either

Output Swing Low

RL = 10 kΩ to V

+/2

13

50

rail

VIN(diff) = −100 mV

50

IO

Output Current

Sourcing, VO to V

−

5

8

(4)

VIN(diff) = 100 mV

4

mA

Sinking, VO to V

+

3.5

7

VIN(diff) = −100 mV

2.5

IS

Supply Current

32

44

µA

46

(4)

The short circuit test is a momentary open loop test.

2.5V AC Electrical Characteristics

(1)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V, V

CM = VO = V

+/2, and R

L > 1MΩ.

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

GBWP

Gain Bandwidth Product

CL = 20 pF, RL = 10 kΩ

128

kHz

SR

Slew Rate

AV = +1, CL = 20 pF

Falling Edge

58

V/ms

RL = 10 kΩ

Rising Edge

48

θ m

Phase Margin

CL = 20 pF, RL = 10 kΩ

64

deg

Gm

Gain Margin

CL = 20 pF, RL = 10 kΩ

26

dB

en

Input-Referred Voltage Noise Density

f = 1 kHz

60

nV/

√Hz

Input-Referred Voltage Noise

0.1 Hz to 10 Hz

2.5

μVPP

in

Input-Referred Current Noise Density

f = 1 kHz

10

fA/

√Hz

THD+N

Total Harmonic Distortion + Noise

f = 100 Hz, RL = 10 kΩ

0.005

%

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond

which the device may be permanently degraded, either mechanically or electrically.

(2)

All limits are specified by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

6

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