LMP2234

www.ti.com

SNOSAW4D – SEPTEMBER 2007 – REVISED MARCH 2013

1.8V DC Electrical Characteristics

(1)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 1.8V, V− = 0V, V

CM = VO = V

+/2, and R

L > 1 MΩ.

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

VOS

Input Offset Voltage

±10

±230

μV

±325

TCVOS

Input Offset Voltage Drift

LMP2234A

±0.3

±0.75

μV/°C

LMP2234B

±0.3

±2.5

IBIAS

Input Bias Current

±0.02

±1.0

pA

±50

IOS

Input Offset Current

±5

fA

CMRR

Common Mode Rejection Ratio

0V

≤ VCM ≤ 0.8V

76

92

dB

75

PSRR

Power Supply Rejection Ratio

1.6V

≤ V+ ≤ 5.5V

83

120

dB

VCM = 0V

82

CMVR

Common Mode Voltage Range

CMRR

≥ 76 dB

-0.2

1.0

V

CMRR

≥ 75 dB

0

1.0

AVOL

Large Signal Voltage Gain

VO = 0.3V to 1.5V

103

120

dB

RL = 10 kΩ to V

+/2

103

VO

Output Swing High

RL = 10 kΩ to V

+/2

12

50

mV

VIN(diff) = 100 mV

50

from either

rail

Output Swing Low

RL = 10 kΩ to V

+/2

13

50

VIN(diff) = −100 mV

50

IO

Output Current (4)

Sourcing, VO to V

−

2.5

5

mA

VIN(diff) = 100 mV

2

Sinking, VO to V

+

2

5

VIN(diff) = −100 mV

1.5

IS

Supply Current

31

42

µA

44

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond

which the device may be permanently degraded, either mechanically or electrically.

(2)

All limits are specified by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

The short circuit test is a momentary open loop test.

Copyright © 2007–2013, Texas Instruments Incorporated

Submit Documentation Feedback

7

Product Folder Links: LMP2234