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LP55231 数据表(PDF) 34 Page - Texas Instruments |
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LP55231 数据表(HTML) 34 Page - Texas Instruments |
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34 / 59 page ![]() 34 LP55231 SNOSCR5D – MARCH 2013 – REVISED DECEMBER 2016 www.ti.com Product Folder Links: LP55231 Submit Documentation Feedback Copyright © 2013–2016, Texas Instruments Incorporated This register is a read-only register. Temperature reading is stored in 8-bit two's complement format. TEMPERATURE READ BITS TEMPERATURE INTERPRETATION (°C, typ.) 11010111 −41 11011000 −40 ... ... 11111110 −2 11111111 −1 00000000 0 00000001 1 00000010 2 ... ... 01011000 88 01011001 89 40 TEMPERATURE WRITE • 40 — Bits [7:0] TEMPERATURE • These bits are used for storing an 8-bit temperature reading acquired from an external sensor, if such a sensor is used. Temperature reading is stored in 8-bit two's complement format, like in 3F TEMPERATURE READ register. • When writing temperature data outside the range of the temperature compensation: Values greater than 89°C are set to 89°C; values less than −39°C are set to −39°C. 41 LED TEST CONTROL • LED test control register • 41 — Bit [7] EN_LEDTEST_ADC • Writing this bit high (1) fires single LED test conversion. LED test measurement cycle is 2.7 milliseconds. • 41 — Bit [6] EN_LEDTEST_INT • 1 = interrupt signal is sent to the INT pin when the LED test is accomplished. • 0 = no interrupt signal is sent to the INT pin when the LED test is accomplished. • Interrupt can be cleared by reading STATUS/INTERRUPT register 3A. • 41 — Bit [5] CONTINUOUS_CONV • 1 = continuous LED test measurement. Not active in power-save mode. • 0 = continuous conversion is disabled. • 41 — Bits [4:0] LED__TEST_CTRL • These bits are used for choosing the LED driver output to be measured. VDD, INT pin and charge-pump output voltage can be measured, also. LED_TEST_CTRL BITS MEASUREMENT 00000 D1 00001 D2 00010 D3 00011 D4 00100 D5 00101 D6 00110 D7 00111 D8 01000 D9 01001 to 01110 Reserved 01111 VOUT 10000 VDD 10001 INT-pin voltage |
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