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L6256 数据表(PDF) 16 Page - STMicroelectronics

部件名 L6256
功能描述  12V COMBO
PDF  28 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

L6256 数据表(HTML) 16 Page - STMicroelectronics

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Auxiliary Control Register
Address: 0111
Bit Function
Mnemonic
Init State
R/W
Bit #
Read 1 indicates:
Start (1)
START
xxx
W
0
N/A
VCM enable (2)
VC_EN
0
W
1
enabled (5)
Spindle enable (3)
SP_EN
0
W
2
enabled (5)
Thermal Limit
OVTEMP
0
R
3
Th Limit
Test Enable (7)
T_EN
0
W
4
enabled (5)
Software POR
SPOR
off
W
5
always 0 (5)
Spare
Register Brake
RBRAKE
disabled (4)
R/W
7
Braking * (6)
NOTES:
(1) Start disables slew rate control. It also changes the back EMF detection circuitry from 3 phase to single phase.
(2) shuts down active circuitry and drives to the ground state when 0. A transition on this bit is required to reactivate the VCM. see state dia-
gram.
(3) shuts down active circuitry and tristates when 0. A transition on this bit is required to reactivate the spindle circuitry. see state diagram.
(4) Writing to brake will cause a register park, then a brake sequence (an internal POR), without causing an external POR\. Thus, the rest of
the system including the processor will not be reset.
(5) Optional bits.
(6) The register brake function has been redesigned to allow use of a momentary, current limited brake during start mode only. Asserting this
bit overrides the CCTR or CPR register contents without disturbing them, and causes a brake on the spindle outputs.
Resetting the bit restores the previous state ( the outputs were in before the bit was asserted). DO NOT attempt to change the CCTR or
CPR, or send a SP_CLK while this bit is asserted.
(7) Test Enable is used to enable manufacturer specific test circuitry within the chip. This bit should be initialized with a 0 value and left at 0
at all times. Do not attempt to use this bit for any reason unless you have complete manufacturer specific information.
Test Register
Address: 1000
Bit Function
Init State
R/W
Read 1 indicates:
Bits: TBD
up to 16 read, 8 write
NOTE: The test register requires 2 level access. That is, the test enable bit in the Aux Control Register must be written to with a 1 or the test
register is locked out.
Status Register (read only)
Mnemonic
Address: 0100
Status Bit
High Indicates
Address
Dead Bit (unusable for timing reasons)
-
n/a
Bit 0
UV detect
UV_DET *
Undervoltage Occuring
Bit 1
Overtemperature Warning
TWARN
Exceeded Warning Temp
Bit 2
Overtemperature Shutdown
OVTEMP
Exceeded Shutdown Temp (1)
Bit 3
Version Number (2 bits)
VERS *
(2)
4 = Bit 0
5 =Bit 1
Vendor Number
VENDOR
(2)
Bit 6
Spindle Current Limit
SILIM
Current Has Exceeded
threshold (7) (8)
Bit 7
Dead Bit (unusable for timing reasons)
n/a
Bit 8
EMF XOR Output
EMFX
Changes state on XOR of
Comparator A, B, C
Bit 9
EMF A Comparator Output
EMFA
Positive High
Bit 10
DAC write
XOR
Write (3)
Bit 11
Transmission Error
TX_ERR *
CSELB occurs during active
transmission (4) (7)
Bit 12
Aux_Write
AUX_WR
Toggles (5)
Bit 13
Phase Detect
PH_DET
Correct PWM phasing (6)
Bit 14
Spindle Forward
SP_FWD *
Reports correct spindle
rotation direction
Bit 15
NOTE: the status register is readable during a POR\ for in circuit testability.
(1) Overtemperature Shutdown or Warning do not cause POR\. This arrangement allows graceful recovery from overtemperature conditions.
(2) Vendor bit = 0 for Unitrode, 1 for ST. Version number, Bits 0,1 allow 4 chip versions. For the Dolphin: Bit 0 = 1, Bit 1 = 0. This allows de-
L6256
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