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AD8318ACPZ-R2 数据表(PDF) 21 Page - Analog Devices

部件名 AD8318ACPZ-R2
功能描述  1 MHz to 8 GHz, 70 dB Logarithmic Detector/Controller
PDF  24 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

AD8318ACPZ-R2 数据表(HTML) 21 Page - Analog Devices

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AD8318
Rev. B | Page 21 of 24
CHARACTERIZATION SETUP AND METHODS
To measure noise spectral density, the 0 Ω resistor in series with
the VOUT pin is replaced with a 1 μF dc blocking capacitor.
The capacitor is used because the Rohde & Schwarz FSEA
spectrum analyzer cannot handle dc voltages at its RF input.
The CLPF pin is left open for data collected for Figure 19. For
Figure 20, a 1 μF capacitor is placed between CLPF and ground.
The large capacitor filters the noise from the detector stages
of the log amp. Noise spectral density measurements are taken
using the FSEA spectrum analyzer and the SMT06 signal
generator. The signal generator frequency is set to 2.2 GHz.
The spectrum analyzer has a span of 10 Hz, resolution
bandwidth of 50 Hz, video bandwidth of 50 Hz, and averages
the signal 100×. Data is adjusted to account for the dc blocking
capacitor impedance on the output at lower frequencies.
The general hardware configuration used for the AD8318
characterization is shown in Figure 47. The primary setup used
for characterization is measurement mode. The characterization
board is similar to the customer evaluation board with the
exception that the RF input has a Rosenberger SMA connector
and R10 has changed to a 1 kΩ resistor to remove cable
capacitance from the bench characterization setup. Slope and
intercept are calculated in this data sheet and in the production
environment using linear regression from −50 dBm to −10 dBm.
The slope and intercept generate an ideal line. Log conformance
error is the difference from the ideal line and the measured
output voltage for a given temperature in dB. For additional
information on the error calculation, refer to the Device
Calibration and Error Calculation section.
The hardware configuration for pulse response measurement
replaces the 0 Ω series resistor at the VOUT pin with a 40 Ω
resistor; the CLPF pin remains open. Pulse response time is
measured using a Tektronix TDS5104 digital phosphor
oscilloscope. Both channels on the scope are configured for
50 Ω termination. The 10 Ω internal series resistance at VOUT,
combined with the 40 Ω resistor, attenuates the output voltage
level by two. RF input frequency is set to 100 MHz with
−10 dBm at the input of the device. The RF burst is generated
using a Rohde & Schwarz SMT06 with the pulse option with a
period of 1.5 μs, a width of 0.1 μs, and a pulse delay of 0.04 μs.
The output response is triggered using the video output from
the SMT06. Refer to Figure 47 for an overview of the test setup.
VIDEO
OUT
RF OUT
–7dBm
ROHDE & SCHWARZ
SMT06
TEKTRONIX
TDS5104
CH1* CH3* TRIGGER
VOUT
GND
5V
AD8318
VPOS
VSET
INHI
INLO
40Ω
52.3Ω
1nF
1nF
*50Ω
TERMINATION
3dB
SPLITTER
Figure 47. Pulse Response Measurement Test Setup



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