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L9949 数据表(PDF) 16 Page - STMicroelectronics |
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L9949 数据表(HTML) 16 Page - STMicroelectronics |
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16 / 20 page ![]() L9949 16/20 Figure 8. SPI-Interface - Transfer Timing Diagram IDOLK Tristate Leakage Current VCSN =VCC, 0 V < VDO <VCC -10 10 µA CDO Tristate Input Capacitance VCSN =VCC, 0 V<VCC <5.5 V 10 15 pF DO timing (see Figg. 10 & 11) tr DO DO Rise Time CL =100 pF, Iload = -1mA 50 100 ns tf DO Data Out Fall Time CL =100 pF, Iload = 1mA 50 100 ns ten DO tri L DO Enable Time from tristate to low level CL =100 pF, Iload = 1mA pull-up load to VCC 80 250 ns ten DO L tri DO Disable Time from low level totristate CL =100 pF, Iload = 4mA pull-up load to VCC 200 400 ns ten DO tri H DO Enable Time from tristate to high level CL =100 pF, Iload = -1mA pull-down load to GND 80 250 ns ten DOH tri DO Disable Time from high level totristate CL =100 pF, Iload = -4mA ppull-down load to GND 200 400 ns td DO DO Delay Time VDO < 0.3 VCC, VDO > 0.7 VCC, CL =100 pF 50 250 ns (1) Value of input capacity is not measured in production test. Parameter guarenteed by design. (2) DI timing parameters tested in production by a passed/failed test: Tj=-40°C/+25°C: SPI communication @2MHz Tj=+125°C: SPI communication @1.25MHz SPI INTERFACE ELECTRICAL CHARACTERISTCS (continued) VS =8to 16 V, VCC = 4.5 to 5.5 V, Tj = -40 to 150 °C, unless otherwise specified. The voltages are refered to GND and currents are assumed positive, when the current flows into the pin . Symbol Parameter Test Condition Min. Typ. Max. Unit 0 1 0 1 time time time time time CSN high to low: DO enabled actual data DI: data will be accepted on the rising edge of CLK signal new data CSN CLK DI DO e.g.OUT1 DO: data will change on the falling edge of CLK signal status information fault bit CSN low to high: actual data is transfered to output power switches old data 12 3 4 5 6 78 9 10 11 012 13 14 15 1 0 actual l data 1 2 3 456 78 9 10 11 012 13 14 15 1 2 3 456 78 9 10 11 012 13 14 15 |
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