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LRI512 数据表(PDF) 44 Page - STMicroelectronics |
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LRI512 数据表(HTML) 44 Page - STMicroelectronics |
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44 / 54 page ![]() LRI512 44/54 MAXIMUM RATING Stressing the device above the rating listed in the Absolute Maximum Ratings table may cause per- manent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not im- plied. Exposure to Absolute Maximum Rating con- ditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality docu- ments. Table 56. Absolute Maximum Ratings Note: 1. IPC/JEDEC J-STD-020A 2. ESD test: ISO10373-7 specification Symbol Parameter Condition Min. Max. Unit TSTG Storage Temperature W4 ST antistatic bag, max 23 months 15 25 °C SB Mounted wafer in a wafer- sawing box (8"), max 25 wafers 15 25 °C A1T/ISOR 40-60% RH, max 2 Years 15 25 °C A1S/ISOR Reels in shrink film and packed in hexagonal cardboard box 15 25 °C A2T/ISOK 40% RH, max 1 year 15 25 °C C40 Reels in ST cardboard box 15 25 °C VMAX Maximum Input Voltage on AC0 / AC1 –7 7 V VESD Electrostatic Discharge Voltage2 A1T/ISOR ISO 10373-7 –7000 7000 V A1S/ISOR ISO 10373-7 –7000 7000 V A2T/ISOK ISO 10373-7 –7000 7000 V C40 ISO 10373-7 –7000 7000 V |
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