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M28C17 数据表(PDF) 7 Page - STMicroelectronics |
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M28C17 数据表(HTML) 7 Page - STMicroelectronics |
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7 / 17 page ![]() Symbol Alt Parameter Test Condition M28C17 Unit -90 -120 -150 min max min max min max tAVQV tACC Address Valid to Output Valid E = VIL, G = VIL 90 120 150 ns tELQV tCE Chip Enable Low to Output Valid G = VIL 90 120 150 ns tGLQV tOE Output Enable Low to Output Valid E = VIL 40 45 50 ns tEHQZ (1) tDF Chip Enable High to Output Hi-Z G = VIL 0 400450 50 ns tGHQZ (1) tDF Output Enable High to Output Hi-Z E = VIL 0 400450 50 ns tAXQX tOH Address Transition to Output Transition E = VIL, G = VIL 00 0 ns Note: 1. Output Hi-Z is defined as the point at which data is no longer driven. Table 8. Read Mode AC Characteristics (TA = 0 to 70 °C or –40 to 85°C; VCC = 4.5V to 5.5V) AI01511B VALID tAVQV tAXQX tGLQV tEHQZ tGHQZ DATA OUT A0-A10 E G DQ0-DQ7 tELQV Hi-Z Figure 9. Read Mode AC Waveforms Note: Write Enable (W) = High 7/17 M28C17 |
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