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M28C64C 数据表(PDF) 6 Page - STMicroelectronics |
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M28C64C 数据表(HTML) 6 Page - STMicroelectronics |
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6 / 15 page ![]() Symbol Alt Parameter Test Condition M28C64C Unit -150 -200 -250 min max min max min max tAVQV tACC Address Valid to Output Valid E=VIL,G = VIL 150 200 250 ns tELQV tCE Chip Enable Low to Output Valid G= VIL 150 200 250 ns tGLQV tOE Output Enable Low to Output Valid E=VIL 75 100 110 ns tEHQZ (1) tDF Chip Enable High to Output Hi-Z G= VIL 050 0 60 065 ns tGHQZ (1) tDF Output Enable High to Output Hi-Z E=VIL 050 0 60 065 ns tAXQX tOH Address Transition to Output Transition E= VIL,G = VIL 00 0 ns Note: 1. Output Hi-Z is defined as the point at which data is no longer driven. Table 8. Read Mode AC Characteristics (TA = 0 to 70 °C or –40 to 85°C, VCC = 4.5V to 5.5V) AI00749B VALID tAVQV tAXQX tGLQV tEHQZ tGHQZ DATA OUT A0-A12 E G DQ0-DQ7 tELQV Hi-Z Figure 7. Read Mode AC Waveforms Note: Write Enable (W) = High 6/15 M28C64C, M28C64X |
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