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APM32E103RCT6-R 数据表(PDF) 56 Page - Geehy Semiconductor Co., Ltd. |
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APM32E103RCT6-R 数据表(HTML) 56 Page - Geehy Semiconductor Co., Ltd. |
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56 / 79 page ![]() www.g eeh y.co m Pag e 55 5.11.1.3. Temperature Table 43 Temperature Symbol Parameter Conditions Minimum value Typical value Maximum value Slope Average slope(VDD = 3.3V,TA = -40~105℃) 3.0 3.7 3.8 mV/ºC V25 Voltage in 25℃(VDD = 2.0-3.6V) - 1.46 - V 5.11.2. DAC Test parameter description: ⚫ DNL differential non-linear error: the deviation between two consecutive codes is-1 LSB ⚫ INL integral non-linear error: the difference between the measured value at code i and the value at code i on the connection between code 0 and the last code 4095 Table 44 DAC Characteristics Symbol Parameter Conditions Minimum value Typical value Maximum value Unit VDDA Analog power supply voltage - 2.4 - 3.6 V RLOAD Resistive load Load is connected to VSSA with buffer on 5 - - kΩ RO Output impedance The resistive load between DAC_OUT and VSS is 1.5MΩ with buffer off - - 15 kΩ CLOAD Capacitive load Maximum capacitive load at DAC_OUT pin with buffer on - - 50 pF DAC_OUT min Low DAC_OUT voltage with buffer Maximum output offset of DAC, (0x0E1) corresponding to 12-bit input code to VREF+= (0xF1B) at 3.6V and VREF+= (0x154) at 2.4V and (0xEAC) 0.39 - 1.94 V DAC_OUT max High output voltage with buffer -10.84 - 4.66 V DNL Differential non-linear error Configured with 12-bit DAC -1.03 - 0.79 LSB INL Integral non-linear error Configured with 12-bit DAC -3.86 - 2.46 LSB Offset Offset error VREF+=3.6V, configuring 12-bit DAC -2.57 - 9.49 LSB Gain error Gain error Configured with 12-bit DAC -0.0013 - 0.0045 % Note: It is obtained from a comprehensive evaluation and is not tested in production. Table 1. Temperature Sensor Features Symbol Parameters Minimum Value Typical Value Maximum Value Unit |
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