| 数据搜索系统,热门电子元器件搜索 |
|
M48T02 数据表(PDF) 12 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
M48T02 数据表(HTML) 12 Page - STMicroelectronics |
|
12 / 15 page ![]() The second approach is better suited to a manu- facturing environment, and involves the use of some test equipment. When the Frequency Test (FT) bit, the seventh-most significant bit in the Day Register, is set to a ’1’, and the oscillator is running at 32,768 Hz, the LSB (DQ0) of the Seconds Reg- ister will toggle at 512 Hz. Any deviation from 512 Hz indicates the degree and direction of oscillator frequency shift at the test temperature. For exam- ple, a reading of 512.01024 Hz would indicate a +20 ppm oscillator frequency error, requiring a -10(WR001010) to be loaded into the Calibration Byte for correction. Note that setting or changing the Calibration Byte does not affect the Frequency test output frequency. The device must be selected and address 7F9h must be held constant when reading the 512 Hz on DQ0. The FT bit must be set using the same methodused to set the clock, using the Write bit. The LSB of the Seconds Register is monitored by holding the M48T02/12 in an extended read of the Seconds Register, without having the Read bit set. The FT bit MUST be reset to ’0’ for normal clock operations to resume. For more information on calibration, see the Appli- cation Note AN924 ”TIMEKEEPER Calibration”. POWER SUPPLY DECOUPLING and UNDER- SHOOT PROTECTION ICC transients, including those produced by output switching, can produce voltage fluctuations, result- ing in spikes on the VCC bus. These transients can be reduced if capacitors are used to store energy, AI02169 VCC 0.1 µF DEVICE VCC VSS Figure 12. Supply Voltage Protection which stabilizes the VCC bus. The energy stored in the bypass capacitors will be releasedas low going spikes are generated or energy will be absorbed when overshoots occur. A bypass capacitor value of 0.1 µF (as shown in Figure 12) is recommended in order to provide the needed filtering. In addition to transients that are caused by normal SRAM operation, power cycling can generate negative voltage spikes on VCC that drive it to values below VSS by as much as one Volt. These negative spikes can cause data corruption in the SRAM while in battery backup mode. To protect from these voltage spikes, it is recommeded to connecta schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS). Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is recommended for surface mount. CLOCK OPERATION (cont’d) 12/15 M48T02, M48T12 |
|
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |