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M58LW032D 数据表(PDF) 30 Page - STMicroelectronics |
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M58LW032D 数据表(HTML) 30 Page - STMicroelectronics |
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30 / 51 page ![]() M58LW032D 30/51 Figure 12. Write AC Waveforms, Chip Enable Controlled Note: 1. VIH = Device Disabled (first edge of E0, E1 or E2), VIL = Device Enabled (first edge of E0, E1 or E2). Refer to Table 2 for more details. Table 18. Write AC Characteristics, Chip Enable Controlled. Symbol Parameter Test Condition M58LW032D Unit 90 - 110 tAVEH Address Valid to Chip Enable High W = VIL Min 50 ns tDVEH Data Input Valid to Chip Enable High W = VIL Min 50 ns tWLEL Write Enable Low to Chip Enable Low Min 0 ns tVPHEH Program/Erase Enable High to Chip Enable High Min 0 ns tEHAX Chip Enable High to Address Transition W = VIL Min 0 ns tEHBL Chip Enable High to Status/(Ready/Busy) low Max 500 ns tEHDX Chip Enable High to Input Transition W = VIL Min 0 ns tEHWH Chip Enable High to Write Enable High Min 0 ns tGHEL Output Enable High to Chip Enable Low Min 20 ns tEHGL Chip Enable High to Output Enable Low Min 35 ns tEHEL Chip Enable High to Chip Enable Low Min 30 ns tELEH Chip Enable Low to Chip Enable High W = VIL Min 70 ns AI06242 DQ0-DQ15 STS E2, E1, E0(1) A0-A21 W G INPUT VALID tEHWH tAVEH tELEH tWLEL VPEN tEHAX tEHEL tEHDX tDVEH tVPHEH tEHGL tGHEL tEHBL (Ready/Busy mode) |
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