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AS1113 数据表(PDF) 19 Page - ams-OSRAM AG

部件名 AS1113
功能描述  50mA, 16-Channel LED Driver with Diagnostics
PDF  26 Pages
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制造商  AMSOSRAM [ams-OSRAM AG]
网页  https://ams-osram.com/
标志 AMSOSRAM - ams-OSRAM AG

AS1113 数据表(HTML) 19 Page - ams-OSRAM AG

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www.austriamicrosystems.com/LED-Driver-ICs/AS1113
Revision 1.04
17 - 24
AS1113
Datasheet - A p p l i c a t i o n I n f o r m a t i o n
9 Application Information
Error Detection
The AS1113 features two types of error detection. The error detection can be used on-the-fly, for active LEDs, without
any delay, or by entering into low-current diagnosis mode.
Error Detection On-The-Fly
Error detection on-the-fly will output the status of active LEDs during operation. Without choosing an error mode this
will output the temperature flag at every input/output cycle. Triggering one clock pulse for open or two clock pulses for
short detection during error detection mode outputs the detailed open- or short-error report with the next input/output
cycle (see Figure 18). LEDs turned off at test time are not tested and will show a logic "1" at the detailed error report.
Figure 18. Normal Operation with Error Detection During Operation – 64 Cascaded AS1113s
Error Detection with Low-Current Diagnosis Mode
This unique feature of the AS1113 uses an internal all 1s test pattern for a flicker free diagnosis of all LEDs. This error
detection mode can be started at the end of each input cycle (see Figure 19).
Figure 19. Low-Current Diagnosis Mode with Internal All 1s Test Pattern – 64 Cascaded AS1113s
Display
SDI
SDO
CLK
OEN
LD
Current
Data1
Data2
Data3
Data2
Data3
Data4
T/O or S Error Code
Data1
T/O or S Error Code
Data0
T/O or S Error Code
Data2
1024x
1024x
1024x
Clock for Error
Mode 0x/1x/2x
Rising Edge of OEN
Acquisition of Error Status
Falling Edge of LD; Error Register is
copied into Shift Register
≤ 50mA
GEF
GEF
GEF = Global Error Flag
Falling Edge of LD; Error Register is
copied into Shift Register
Clock for Error
Mode 0x/1x/2x
Rising Edge of OEN
Acquisition of Error Status
Clock for Error
Mode 1x/2x
3x Clocks Low-
Current Mode
1024x
1024x
Data0
Rising Edge of OEN
Acquisition of Error Status
Falling Edge of LD; Error Register
is copied into Shift Register
GEF
O or S Error Code from
All 1s Test Pattern
Temperature Error Code
Use Internal All 1s
Test Pattern
≤ 50mA
≤ 50mA
SDI
SDO
CLK
OEN
LD
≤ 0.8mA
GEF = Global Error Flag
1024x
Data1
Data2
Data2
Data3
T/O or S Error Code
Data0
GEF
Display
Current
Low-Current Diagnosis Mode
Data1



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