AI00825

0.8VCC

0.2VCC

0.7VCC

0.3VCC

Figure 3. AC Testing Input Output Waveforms

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

Input and Output Timing

Reference Voltages

AC MEASUREMENT CONDITIONS

Note that Output Hi-Z is defined as the point where data

is no longer driven.

Symbol

Parameter

Test Condition

Min

Max

Unit

Input Capacitance

5

pF

Output Capacitance

5

pF

Note: 1. Sampled only, not 100% tested.

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

Input Leakage Current

0V

±2.5

µA

Output Leakage Current

0V

Q in Hi-Z

±2.5

µA

Supply Current (TTL Inputs)

3

mA

Supply Current (CMOS Inputs)

2

mA

Supply Current (Standby)

50

µA

Input Low Voltage (ST93CS66,67)

4.5V

–0.1

0.8

V

Input Low Voltage (ST93CS66)

3V

–0.1

V

Input Low Voltage (ST93CS67)

2.5V

–0.1

V

Input High Voltage (ST93CS66,67)

4.5V

2

V

Input High Voltage (ST93CS66)

3V

V

Input High Voltage (ST93CS67)

2.5V

V

Output Low Voltage

0.4

V

µA

0.2

V

Output High Voltage

µA

2.4

V

V

3/16

ST93CS66, ST93CS67