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TDA7563ASM 数据表(PDF) 14 Page - STMicroelectronics |
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TDA7563ASM 数据表(HTML) 14 Page - STMicroelectronics |
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14 / 35 page ![]() Diagnostics functional description TDA7563A 14/35 Figure 20. SVR and output behavior (case 1: without turn-on diagnostic) Figure 21. SVR and output pin behavior (case 2: with turn-on diagnostic) The information related to the outputs status is read and memorized at the end of the current pulse top. The acquisition time is 100 ms (typ.). No audible noise is generated in the process. As for SHORT TO GND / VS the fault-detection thresholds remain unchanged from 26 dB to 12 dB gain setting. They are as follows:TDA7563A Figure 22. Thresholds for short to GND/VS Bias (power amp turn-on) t Diagnostic Enable (Permanent) Permanent diagnostic acquisition time (100mS Typ) Permanent Diagnostics data (output) permitted time I2CB DATA Vsvr Out FAULT event Read Data Bias (power amp turn-on) permitted time Turn-on diagnostic acquisition time (100mS Typ) t Read Data Permanent diagnostic acquisition time (100mS Typ) Permanent Diagnostics data (output) permitted time Diagnostic Enable (Turn-on) Turn-on Diagnostics data (output) permitted time I2CB DATA Vsvr Out Diagnostic Enable (Permanent) FAULT event D01AU1253 S.C. to GND x S.C. to Vs 0V 1.8V VS-1.8V VS x Normal Operation 1.2V VS-1.2V |
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