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TXDV412 数据表(PDF) 3 Page - STMicroelectronics |
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TXDV412 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 5 page ![]() 375 0123456789 10 11 12 0 2 4 6 8 10 12 14 16 18 20 180 O =180 o =120 o =90 o =60 o =30 o T(RMS) I(A) P(W) Fig.1 : Maximum RMS power dissipation versus RMS on-state current (F=50Hz). (Curves are cut off by (dI/dt)c limitation) 0 20 40 60 80 100 120 140 0 2 4 6 8 10 12 14 16 18 20 -90 -95 -100 -105 -110 -115 -120 -125 P(W) Tamb(C) o Tcase ( C) o Rth = 0 C/W 1C/W 2C/W 4C/W o o o o Fig.2 : Correlation between maximum RMS power dissipation and maximum allowable temperatures (Tamb and Tcase) for different thermal resistances heatsink + contact. 0 10203040 5060708090 100 110 120 130 0 2 4 6 8 10 12 14 =180 o Tcase( C) o I(A) T(RMS) Fig.3 : RMS on-state current versus case temperature. 1E-3 1E-2 1E-1 1E+0 1E+1 1E +2 5E+2 0.01 0.1 1 Zth/Rth Zth(j-c) Zth(j-a) tp(s) Fig.4 : Relative variation of thermal impedance versus pulse duration. Fig.5 : Relative variation of gate trigger current and holding current versus junction temperature. Fig.6 : Non Repetitive surge peak on-state current versus number of cycles. TXDV 412 ---> 812 3/5 |
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