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T610H 数据表(PDF) 4 Page - STMicroelectronics |
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T610H 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 9 page ![]() Characteristics T610H 4/9 Doc ID 15713 Rev 1 Figure 5. Relative variation of gate trigger current and voltage versus junction temperature (typical values) Figure 6. Relative variation of holding and latching current versus junction temperature (typical values) I GT,VGT[Tj]/ IGT,VGT[Tj=25 °C] 0.0 0.5 1.0 1.5 2.0 2.5 -50 -25 0 25 50 75 100 125 150 IGTQ1-Q2 VGT Q1- Q2 -Q3 IGT Q3 Tj(°C) I H,IL [Tj]/ IH,IL [Tj=25 °C] 0.0 0.5 1.0 1.5 2.0 -50 -25 0 25 50 75 100 125 150 IH IL Tj(°C) Figure 7. Surge peak on-state current versus number of cycles Figure 8. Non-repetitive surge peak on-state current and corresponding value of I2t I TSM(A) 0 5 10 15 20 25 30 35 40 45 50 55 60 65 1 10 100 1000 Non repetitive T j initial=25 °C One cycle t=20ms Repetitive T C=138 °C Number of cycles I TSM(A), I²t (A²s) 1 10 100 1000 0.01 0.10 1.00 10.00 T j initial=25 °C dI/dt limitation: 50 A/µs I TSM I²t tP(ms) Sinusoidal pulse width tp < 10 ms Figure 9. On-state characteristics (maximum values) Figure 10. Relative variation of critical rate of decrease of main current versus junction temperature ITM (A) 1 10 100 012 345 Tj=25 °C Tj=150 °C T j max : V to = 0.80 V R d = 62 mΩ VTM (V) (dI/dt)C [Tj]/ (dI/dt)c [Tj=150 °C] 0 1 2 3 4 5 6 7 8 9 10 11 25 50 75 100 125 150 Tj(°C) |
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