DA6501.001

27 October 2008

2 (16)

BLOCK DIAGRAM

S&H

ADC

DIG

FIL

COMMON

NI

PI

VDD

GND

MCLK

SDA

XCLR

EOC

SCL

DIG

INT

Figure 1. MAS6501 block diagram

ABSOLUTE MAXIMUM RATINGS

All Voltages with Respect to Ground

Parameter

Symbol

Conditions

Min

Max

Unit

Supply Voltage

During conversion

No conversion

- 0.3

- 0.3

3.8

6.0

V

Voltage Range for All Pins

- 0.3

V

Latchup Current Limit

For all pins,

test according to

Micro Analog Systems

specification ESQ0141.

See note below.

- 100

+ 100

mA

Junction Temperature

+ 175

°C

Storage Temperature

- 55

+125

°C

Note: Stresses beyond the values listed may cause a permanent damage to the device. The device may not

operate under these conditions, but it will not be destroyed.

Note: This is a CMOS device and therefore it should be handled carefully to avoid any damage by static voltages

(ESD).

Note: In latchup testing the supply voltages are connected normally to the tested device. Then pulsed test current is fed

to each input separately and device current consumption is observed. If the device current consumption increases

suddenly due to test current pulses and the abnormally high current consumption continues after test current pulses are

cut off then the device has gone to latch up. Current pulse is turned on for 10 ms and off for 20 ms.

RECOMMENDED OPERATION CONDITIONS

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

Supply Voltage

2.0

2.35

3.6

V

Operating Temperature

-20

+25

+60

°C

The device performance may deteriorate in the long run if the Recommended Operation Conditions limits are continuously exceeded.