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TC1301A-ADAVUATR 数据表(PDF) 18 Page - Microchip Technology |
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TC1301A-ADAVUATR 数据表(HTML) 18 Page - Microchip Technology |
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18 / 28 page ![]() TC1301A/B DS21798C-page 18 © 2008 Microchip Technology Inc. EQUATION 6-3: The maximum power dissipation capability for a package can be calculated given the junction to ambient thermal resistance and the maximum ambient temperature for the application. The following equation can be used to determine the package maximum internal power dissipation. EQUATION 6-4: EQUATION 6-5: EQUATION 6-6: 6.3 Typical Application Internal power dissipation, junction temperature rise, junction temperature, and maximum power dissipation are calculated in the following example. The power dissipation as a result of ground current is small enough to be neglected. 6.3.1 POWER DISSIPATION EXAMPLE Device Junction Temperature Rise The internal junction temperature rise is a function of internal power dissipation and the thermal resistance from junction to ambient for the application. The thermal resistance from junction to ambient (R θ JA) is derived from an EIA/JEDEC standard for measuring thermal resistance for small surface-mount packages. The EIA/JEDEC specification is JESD51-7, “High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages”. The standard describes the test method and board specifications for measuring the thermal resistance from junction to ambient. The actual thermal resistance for a particular application can vary depending on many factors such as copper area and thickness. Refer to AN792, “A Method To Determine How Much Power a SOT-23 Can Dissipate in Your Application” (DS00792), for more information regarding this subject. T JMAX () P TOTAL R θ JA × T AMAX + = Where: TJ(MAX) = Maximum continuous junction tem- perature PTOTAL = Total device power dissipation R θ JA = Thermal resistance from junction- to-ambient TAMAX = Maximum ambient temperature P DMAX () T JMAX () T AMAX () – () R θ JA --------------------------------------------------- = Where: PD(MAX) = Maximum device power dissipation TJ(MAX) = Maximum continuous junction temperature TAMAX = Maximum ambient temperature R θ JA = Thermal resistance from junction- to-ambient T JRISE () P DMAX () R θ JA × = Where: TJ(RISE) = Rise in device junction temperature over the ambient temperature PD(MAX) = Maximum device power dissipation R θ JA = Thermal resistance from junction- to-ambient T J T JRISE () T A + = Where: TJ = Junction Temperature TJ(RISE) = Rise in device junction temperature over the ambient temperature TA = Ambient Temperature Package Package Type = 3x3 DFN8 Input Voltage VIN = 2.7V to 4.2V LDO Output Voltages and Currents VOUT1 = 2.8V IOUT1 = 300 mA VOUT2 = 1.8V IOUT2 = 150 mA Maximum Ambient Temperature TA(MAX) = 50°C Internal Power Dissipation Internal power dissipation is the sum of the power dissipation for each LDO pass device. PLDO1(MAX) =(VIN(MAX) - VOUT1(MIN)) x IOUT1(MAX) PLDO1 = (4.2V - (0.975 x 2.8V)) x 300 mA PLDO1 = 441.0 milliWatts PLDO2 = (4.2V - (0.975 X 1.8V)) x 150 mA PLDO2 = 366.8 milliWatts PTOTAL =PLDO1 + PLDO2 PTOTAL= 807.8 milliWatts TJ(RISE) =PTOTAL x RqJA TJRISE = 807.8 milliWatts x 41.0° C/W TJRISE =33.1°C |
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