WM2613

Production Data Rev 1.0

WOLFSON MICROELECTRONICS LTD

Production Data Rev 1.0 June 1999

4

ELECTRICAL CHARACTERISTICS

Test Conditions:

Ω, C

recommended operating free-air temperature range (unless noted otherwise)

PARAMETER

SYMBOL

TEST

CONDITIONS

MIN

TYP

MAX

UNIT

Static DAC Specifications

Resolution

12

bits

Integral non-linearity

INL

See Note 1

LSB

Differential non-linearity

DNL

See Note 2

LSB

Zero code error

ZCE

See Note 3

3

mV

Gain error

GE

See Note 4

% FSR

D.c power supply rejection ratio

d.c. PSRR

See Note 5

0.5

mV/V

Zero code error temperature

coefficient

See Note 6

3

ppm/

°C

Gain error temperature coefficient

See Note 6

1

ppm/

°C

DAC Output Specifications

Output voltage range

0

AVDD - 0.4

V

Output load regulation

2k

Ω to 10kΩ load. See Note 7

0.1

0.3

%

Power Supplies

Active supply current

IDD

No load, VIH = DVDD, VIL = 0V

AVDD = DVDD = 5V,

Slow

Fast

AVDD = DVDD = 3V,

Slow

Fast

0.5

1.6

0.4

1.4

1.3

3.0

1.1

2.7

mA

mA

mA

mA

Power down supply current

No load, all digital inputs 0V

or DVDD. See Note 9

0.01

10

µA

Dynamic DAC Specifications

Slew rate

DAC code 128 to 4095,

10%-90% See Note 10

Slow

Fast

1.5

8

V/

µs

V/

µs

Settling time

DAC code 128 to 4095

Slow

Fast

3.5

1.0

µs

µs

Glitch energy

Code 2047 to code 2048

1

nV-s

Signal to noise ratio

SNR

TA = 25

°C See Note 12

65

78

dB

Signal to noise and distortion ratio

SNRD

TA = 25

°C See Note 12

58

69

dB

Total harmonic distortion

THD

TA = 25

°C See Note 12

-68

-60

dB

Spurious free dynamic range

SPFDR

25

°C See Note 12

60

72

dB