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MPC5646C 数据表(PDF) 39 Page - Freescale Semiconductor, Inc |
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MPC5646C 数据表(HTML) 39 Page - Freescale Semiconductor, Inc |
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39 / 114 page ![]() MPC5646C Microcontroller Data Sheet, Rev. 3 Preliminary—Subject to Change Without Notice Freescale Semiconductor 39 4 Electrical Characteristics This section contains electrical characteristics of the device as well as temperature and power considerations. This product contains devices to protect the inputs against damage due to high static voltages. However, it is advisable to take precautions to avoid application of any voltage higher than the specified maximum rated voltages. To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD or VSS_HV). This could be done by the internal pull-up and pull-down, which is provided by the product for most general purpose pins. The parameters listed in the following tables represent the characteristics of the device and its demands on the system. In the tables where the device logic provides signals with their respective timing characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol column. In the tables where the external system must provide signals with their respective timing characteristics to the device, the symbol “SR” for System Requirement is included in the Symbol column. 4.1 Parameter classification The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better understanding, the classifications listed in Table 5 are used and the parameters are tagged accordingly in the tables where appropriate. NOTE The classification is shown in the column labeled “C” in the parameter tables where appropriate. 4.2 NVUSRO register Portions of the device configuration, such as high voltage supply is controlled via bit values in the Non-Volatile User Options Register (NVUSRO). For a detailed description of the NVUSRO register, see MPC5646C Reference Manual. 7 When MBIST is enabled to run ( STCU Enable = 1), the application must not drive or tie PAD[178) (MDO[0]) to 0 V before the device exits reset (external reset is removed) as the pad is internally driven to 1 to indicate MBIST operation. When MBIST is not enabled (STCU Enable = 0), there are no restriction as the device does not internally drive the pad. 8 These pins can be configured as Nexus pins during reset by the debugger writing to the Nexus Development Interface "Port Control Register" rather than the SIUL. Specifically, the debugger can enable the MDO[7:0], MSEO[1:0], and MCKO ports by programming NDI (PCR[MCKO_EN] or PCR[PSTAT_EN]). MDO[8:11] ports can be enabled by programming NDI ((PCR[MCKO_EN] and PCR[FPM]) or PCR[PSTAT_EN]). Table 5. Parameter classifications Classification tag Tag description P Those parameters are guaranteed during production testing on each individual device. C Those parameters are achieved by the design characterization by measuring a statistically relevant sample size across process variations. T Those parameters are achieved by design characterization on a small sample size from typical devices under typical conditions unless otherwise noted. All values shown in the typical column are within this category. D Those parameters are derived mainly from simulations. |
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