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ADP1876ACPZ-R7 数据表(PDF) 7 Page - Analog Devices

部件名 ADP1876ACPZ-R7
功能描述  600 kHz Dual Output Synchronous Buck
PDF  24 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADP1876ACPZ-R7 数据表(HTML) 7 Page - Analog Devices

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Data Sheet
ADP1876
Rev. A | Page 7 of 24
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Rating
VIN, EN1/EN2, RAMP1/RAMP2
21 V
FB1/FB2, COMP1/COMP2, SS1/SS2, TRK1,
VINLDO, VOUTLDO, VCCO, VDL,
PGOOD1/PGOOD2
−0.3 V to +6 V
ILIM1/ILIM2
−0.3 V to +21 V
BST1/BST2 to SW1/SW2
−0.3 V to +6 V
BST1/BST2, DH1/DH2, SW1/SW2 to
PGND1/PGND2
−0.3 V to +28 V
DL1/DL2 to PGND1/PGND2
−0.3 V to VCCO + 0.3 V
BST1/BST2 to PGND1/PGND2, SW1/SW2 to
PGND1/PGND2 (20 ns Transients)
32 V
SW1, SW2 to PGND1, PGND2
(20 ns Transients)
25 V
DL1/DL2, SW1/SW2, ILIM1/ILIM2 to
PGND1/PGND2 (20 ns Negative Transients)
−8 V
PGND1/PGND2 to AGND
−0.3 V to +0.3 V
PGND1/PGND2 to AGND (20 ns Transients)
−8 V to +4 V
θJA, Multilayer PCB (Natural Convection)1,2
32.6°C/W
Operating Junction Temperature Range3
−40°C to +125°C
Storage Temperature Range
−65°C to +150°C
Maximum Soldering Lead Temperature
260°C
1 Measured with exposed pad attached to the printed circuit board (PCB).
2 Junction-to-ambient thermal resistance (θ
JA) of the package was calculated
or simulated on a multilayer PCB.
3 The junction temperature, T
J, of the device is dependent on the ambient
temperature, TA, the power dissipation of the device, PD, and the junction to
ambient thermal resistance of the package, θJA. Maximum junction
temperature is calculated from the ambient temperature and power
dissipation using the formula, TJ = TA + PD × θJA.
Absolute maximum ratings apply individually only, not in
combination. Unless otherwise specified, all other voltages are
referenced to GND.
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.



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