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TNETE110 数据表(PDF) 16 Page - Texas Instruments |
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TNETE110 数据表(HTML) 16 Page - Texas Instruments |
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16 / 24 page ![]() ThunderLAN ™ TNETE110 PCI ETHERNET ™ CONTROLLER SINGLE-CHIP 10 BASE-T SPWS018B – MARCH 1995 - REVISED MAY 1996 16 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 (c) FIREF TEST CIRCUIT (b) AXMTP AND AXMTN TEST LOAD (AC TESTING) X1 – Fil – Mag 23Z90 (1:1) (a) TTL OUTPUT TEST LOAD 180 Ω FIREF AXMTN AXMTP 78 Ω Point Test CL IOH VLOAD IOL Point Test Test Under Output TTL 50 Ω FXMTN FXMTP X1 50 Ω 50 Ω Point Test 50 Ω X2 50 Ω 50 Ω 25 Ω 25 Ω FXMTN FXMTP Point Test 50 Ω 50 Ω 50 Ω 50 Ω Point Test (e) FXMTP AND FXMTN TEST LOAD (DC TESTING) (d) FXMTP AND FXMTN TEST LOAD (AC TESTING) X2 – Fil – Mag 23Z128 (1: √2) Where: IOL = Refer to IOL in recommended operating conditions IOH = Refer to IOH in recommended operating conditions VLOAD = 1.5 V, typical dc-level verification or 0.7 V, typical timing verification CL = 18 pF, typical load-circuit capacitance Figure 3. Test and Load Circuit switching characteristics of PCI 5 V and 3.3 V (see Note 14 and Figure 4) PARAMETER MIN MAX UNIT tVAL Delay time, PCLK to bused signals valid (see Notes 15 and 16) 2 11 ns |
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