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PCF8523T 数据表(PDF) 49 Page - NXP Semiconductors |
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PCF8523T 数据表(HTML) 49 Page - NXP Semiconductors |
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49 / 75 page ![]() PCF8523 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 4 — 5 July 2012 49 of 74 NXP Semiconductors PCF8523 Real-Time Clock (RTC) and calendar 10. Limiting values [1] Pass level; Human Body Model (HBM), according to Ref. 7 “JESD22-A114”. [2] Pass level; Charged-Device Model (CDM), according to Ref. 8 “JESD22-C101”. [3] Pass level; latch-up testing according to Ref. 9 “JESD78” at maximum ambient temperature (Tamb(max)). [4] According to the store and transport requirements (see Ref. 13 “UM10569”) the devices have to be stored at a temperature of +8 C to +45 C and a humidity of 25 % to 75 %. Table 47. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDD supply voltage 0.5 +6.5 V IDD supply current 50 +50 mA VI input voltage 0.5 +6.5 V VO output voltage 0.5 +6.5 V II input current 10 +10 mA IO output current 10 +10 mA VBAT battery supply voltage 0.5 +6.5 V Ptot total power dissipation - 300 mW VESD electrostatic discharge voltage HBM for all PCF8523 [1] - 2000 V CDM for all packaged PCF8523 [2] - 1500 V Ilu latch-up current [3] -100 mA Tstg storage temperature [4] 65 +150 C Tamb ambient temperature operating device 40 +85 C |
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