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DAC8222FS 数据表(PDF) 2 Page - Analog Devices |
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DAC8222FS 数据表(HTML) 2 Page - Analog Devices |
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2 / 15 page ![]() REV. C –2– DAC8222–SPECIFICATIONS ELECTRICAL CHARACTERISTICS (@ V DD = +5 V or +15 V, VREF A = VREF B = +10 V, VOUT A = VOUT B = 0 V; AGND = DGND = 0 V; TA = Full Temperature Range Specified in Absolute Maximum Ratings; unless otherwise noted. Specifications apply for DAC A and DAC B.) Parameter Symbol Conditions Min Typ Max Units STATIC ACCURACY Resolution N 12 Bits Relative Accuracy INL Endpoint Linearity Error DAC8222A/E/G ±1/2 LSB DAC8222F/H ±1 LSB Differential Nonlinearity DNL All Grades are Guaranteed Monotonic ±1 LSB Full-Scale Gain Error 1 GFSE DAC8222A/E ±1 LSB DAC8222G ±2 LSB DAC8222F/H ±4 LSB Gain Temperature Coefficient ∆Gain/∆Temperature TCGFS (Notes 2, 7) ±2 ±5 ppm/ °C Output Leakage Current IOUT A (Pin 2), ILKG All Digital Inputs = TA = +25 °C ±5 ±10 nA IOUT B (Pin 24) 0000 0000 0000 TA = Full Temp. Range ±50 nA Input Resistance (VREF A, VREF B)RREF (Note 9) 8 11 15 k Ω Input Resistance Match ∆R REF ±0.2 ±1% RREF DIGITAL INPUTS Digital Input High VINH VDD = +5 V 2.4 V VDD = +15 V 13.5 V Digital Input Low VINL VDD = +5 V 0.8 V VDD = +15 V 1.5 V Input Current IIN VIN = 0 V or VDD TA = +25 °C ±0.001 ±1 µA and VINL or VINH TA = Full Temp. Range ±10 µA Input Capacitance 2 CIN DB0–DB11 10 pF WR, LDAC, DAC A/DAC B 15 pF POWER SUPPLY Supply Current IDD All Digital Inputs VINL or VINH 2mA All Digital Inputs 0 V or VDD 10 100 µA DC Power Supply Rejection Ratio PSRR ∆V DD = ±5% 0.002 %/% ( ∆Gain/∆V DD) AC PERFORMANCE CHARACTERISTICS 2 Propagation Delay 4, 5 tPD TA = +25 °C 350 ns Current Settling Time 5, 6 tS TA = +25 °C1 µs Output Capacitance CO Digital Inputs = All 0s 90 pF COUT A, COUT B 90 pF Digital Inputs = All 1s 120 pF COUT A, COUT B 120 pF AC Feedthrough at FTA VREF A to IOUT A; VREF A = 20 V p-p; –70 dB IOUT A or IOUT B f = 100 kHz; TA = +25 °C –70 dB VREF B to IOUT B; VREF B = 20 V p-p; –70 dB FTB f = 100 kHz; TA = +25 °C –70 dB SWITCHING CHARACTERISTICS 2, 3 VDD = +5 V VDD = +15 V +25 °C–40°C to +85°C8 –55°C to +125°C All Temps 10 DAC Select to tAS 150 180 210 60 ns min Write Set-Up Time DAC Select to tAH 0 0 0 0 ns min Write Hold Time LDAC to tLS 80 100 120 60 ns min Write Set-Up Time LDAC to tLH 20 20 20 20 ns min Write Hold Time Data Valid to tDS 220 240 260 100 ns min Write Set-Up Time Data Valid to tDH 00 0 10 ns min Write Hold Time Write Pulse Width tWR 130 160 170 90 ns min LDAC Pulse Width tLWD 100 120 130 60 ns min NOTES 11Measured using internal R FB A and RFB B. Both DAC digital inputs = 1111 1111 1111. 12Guaranteed and not tested. 13See timing diagram. 14From 50% of digital input to 90% of final analog output current. VREF A = VREF B = +10 V; OUT A, OUT B load = 100 Ω, C EXT = 13 pF. 15 WR, LDAC = 0 V; DB0–DB11 = 0 V to V DD or VDD to 0 V. 16Settling time is measured from 50% of the digital input change to where the output voltage settles within 1/2 LSB of full scale. 17Gain TC is measured from +25 °C to T MIN or from +25 °C to T MAX. 18 These limits apply for the commercial and industrial grade products. 19 Absolute temperature coefficient is approximately +50 ppm/ °C. 10 These limits also apply as typical values for V DD = +12 V with +5 V CMOS logic levels and TA = +25 °C. Specifications subject to change without notice. |
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