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LU82541PI 数据表(PDF) 29 Page - Intel Corporation |
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LU82541PI 数据表(HTML) 29 Page - Intel Corporation |
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29 / 46 page ![]() Networking Silicon — 82541(PI/GI/EI) 29 Figure 5. AC Test Loads for General Output Pins VTH VTL VTEST CLK VTEST VSTEP (3.3 V Signalling) Output Delay Tri-State Output output current leakage current TON TOFF < _ Figure 6. AC Test Loads for General Output Pins VTH VTL VTEST CLK TSU VTEST Input VMAX VTEST VTL VTH Input Valid TH Table 19. PCI Bus Interface Timing Measurement Conditions Symbol Parameter PCI 66 MHz 3.3 v Unit VTH Input measurement test voltage (high) 0.6 * VCC V VTL Input measurement test voltage (low) 0.2 * VCC V VTEST Output measurement test voltage 0.4 * VCC V Input signal slew rate 1.5 V/ns |
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