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PCF8564AUG 数据表(PDF) 27 Page - NXP Semiconductors |
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PCF8564AUG 数据表(HTML) 27 Page - NXP Semiconductors |
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27 / 48 page ![]() PCF8564A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 3 — 26 August 2013 27 of 48 NXP Semiconductors PCF8564A Real time clock and calendar 13. Limiting values [1] Pass level; Human Body Model (HBM) according to Ref. 5 “JESD22-A114”. [2] Pass level; Machine Model (MM), according to Ref. 6 “JESD22-A115”. [3] Pass level; latch-up testing, according to Ref. 7 “JESD78” at maximum ambient temperature (Tamb(max)). [4] According to the NXP store and transport conditions (see Ref. 11 “UM10569”) the devices have to be stored at a temperature of +5 C to +45 C and a humidity of 25 % to 75 %. Table 29. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDD supply voltage 0.5 +6.5 V VI input voltage 0.5 +6.5 V VO output voltage 0.5 +6.5 V IDD supply current 50.0 +50.0 mA II input current 10.0 +10.0 mA IO output current 10.0 +10.0 mA ISS ground supply current 50.0 +50.0 mA Ptot total power dissipation - 300 mW VESD electrostatic discharge voltage HBM [1] - 3500 V MM [2] - 250 V Ilu latch-up current all pins but OSCI [3] -100 mA Tstg storage temperature [4] 65 +150 C Tamb ambient temperature operating device 40 +85 C |
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