Application information

TSV521, TSV522, TSV524, TSV521A, TSV522A, TSV524A

16/27

Doc ID 022743 Rev 1

4.7

Long term input offset voltage drift

In a product reliability evaluation, two types of stress acceleration are usable:

●

Voltage acceleration, by changing the applied voltage

●

Temperature acceleration, by changing the die temperature (below the maximum

junction temperature allowed by the technology) with the ambient temperature

The voltage acceleration has been defined based on JEDEC results, and is defined by:

Equation 2

where:

ß

is the voltage acceleration constant in 1/V, constant technology parameter

The temperature acceleration is driven by the Arrhenius model, and is defined by:

Equation 3

where:

k

is the Boltzmann’s constant

is:

Equation 4

the product, the 1000 h duration of the stress corresponds to a number of equivalent months

of usage.

Equation 5

A

FV

e

β

–

()

⋅

=

A

FT

e

E

a

k

------

1

------

1

------

–

⎝⎠

⎛⎞

⋅

=