TSV522IST datasheet(17/27 Pages) STMICROELECTRONICS

17 / 27 page

TSV521, TSV522, TSV524, TSV521A, TSV522A, TSV524A

Application information

Doc ID 022743 Rev 1

17/27

For the operational amplifier, a follower stress condition is used for the reliability evaluation,

with VCC defined in function of the Maximum operating voltage and the absolute maximum

rating (as recommended by the JEDEC standards).

The Vio drift, in µV, of the product after 1000 h duration of stress is tracked with parameters

at different measurement conditions, as for example:

Equation 6

VCC = max. Vop with Vicm=VCC/2

Finally, knowing the calculated number of months and with the measured drift value of the

Vio (corresponding to the electrical characteristics of the respective table) after 1000 h

duration of stress, the ratio of the Vio drift over the square of months, ΔVio in µV/√month, is

defined as the long term drift parameter, the parameter estimating the reliability

performance of the product.

Equation 7

ΔVio = Vio drift / √(months)

4.8

PCB layouts

For correct operation, it is advised to add 10 nF decoupling capacitors as close as possible

to the power supply pins.

4.9

Macromodel

Accurate macromodels of the TSV52x device are available on STMicroelectronics™ website

at www.st.com. This model is a trade-off between accuracy and complexity (that is, time

simulation) of the TSV52x operational amplifiers. It emulates the nominal performance of

a typical device within the specified operating conditions mentioned in the datasheet. It also

helps to validate a design approach and to select the appropriate operational amplifier, but it

does not replace onboard measurements.

TSV522IST 数据表(PDF) 17 Page - STMicroelectronics