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BQ76PL536APAPR 数据表(PDF) 44 Page - Texas Instruments |
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BQ76PL536APAPR 数据表(HTML) 44 Page - Texas Instruments |
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44 / 60 page ![]() bq76PL536A SLUSAD3A – JUNE 2011 – REVISED AUGUST 2012 www.ti.com FUNCTION_CONFIG REGISTER (0x40) 7 6 5 4 3 2 1 0 ADCT[1] ADCT[0] GPAI_REF GPAI_SRC CN[1] CN[0] – 0 The FUNCTION_CONFIG sets the default configuration for special features of the device. [7..6] (ADCT[0,1]): These bits set the conversion timing of the ADC measurement. ADCT[1] ADCT[0] ~Conversion Time ( μs) 0 0 3 0 1 6 (recommended) 1 0 12 1 1 24 [5] (GPAI_REF): This bit sets the reference for the GPAI ADC measurement. 0 = Internal ADC bandgap reference 1 = VREG50 (ratiometric) [4] (GPAI_SRC): This bit controls multiplexing of the GPAI register and determines whether the ADC mux is connected to the external GPAI inputs, or internally to the BAT1 pin. The register results are automatically scaled to match the input. 0 = External GPAI inputs are converted to result in GPAI register 0x01–02. 1 = BAT pin to VSS voltage is measured and reported in the GPAI register. [3..2] (CN[1..0]): These two bits configure the number of series cells used. If fewer than 6 cells are configured, the corresponding OV/UV faults are ignored. For example, if the CN[x] bits are set to 10b (2), then the OV/UV comparators are ignored for cells 5 and 6. CN[1] CN[0] SERIES CELLS 0 0 6 (DEFAULT) 0 1 5 1 0 4 1 1 3 IO_CONFIG REGISTER (0x41) 7 6 5 4 3 2 1 0 CRCNOFLT – – – – – – CRC_DIS The IO_CONFIG sets the default configuration for miscellaneous I/O features of the device. [7] (CRCNOFLT): This bit enables and disables detected CRC errors asserting the FAULT pin. 0 = CRC errors cause the FAULT[CRC] bit to be set and the FAULT pin to assert. The FAULT[CRC] bit must be reset as described in the text. 1 = CRC errors cause the FAULT[CRC] bit to be set and the FAULT pin is not asserted. The FAULT[CRC] bit must be reset as described in the text. 44 Submit Documentation Feedback Copyright © 2011–2012, Texas Instruments Incorporated Product Folder Links :bq76PL536A |
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