MCP601/1R/2/3/4

DS21314G-page 4

© 2007 Microchip Technology Inc.

1.1

Test Circuits

The test circuits used for the DC and AC tests are

shown in Figure 1-2 and Figure 1-2. The bypass

capacitors are laid out according to the rules discussed

in

Section 4.5 “Supply Bypass”.

FIGURE 1-2:

AC and DC Test Circuit for

Most Non-Inverting Gain Conditions.

FIGURE 1-3:

AC and DC Test Circuit for

Most Inverting Gain Conditions.

TEMPERATURE CHARACTERISTICS

Electrical Specifications: Unless otherwise indicated, V

Parameters

Sym

Min

Typ

Max

Units

Conditions

Temperature Ranges

Specified Temperature Range

-40

—

+85

°C

Industrial temperature parts

-40

—

+125

°C

Extended temperature parts

Operating Temperature Range

-40

—

+125

°C

Note

Storage Temperature Range

-65

—

+150

°C

Thermal Package Resistances

Thermal Resistance, 5L-SOT23

θ

JA

—256

—

°C/W

Thermal Resistance, 6L-SOT23

θ

JA

—230

—

°C/W

Thermal Resistance, 8L-PDIP

θ

JA

—85

—

°C/W

Thermal Resistance, 8L-SOIC

θ

JA

—163

—

°C/W

Thermal Resistance, 8L-TSSOP

θ

JA

—124

—

°C/W

Thermal Resistance, 14L-PDIP

θ

JA

—70

—

°C/W

Thermal Resistance, 14L-SOIC

θ

JA

—120

—

°C/W

Thermal Resistance, 14L-TSSOP

θ

JA

—100

—

°C/W

Note:

The Industrial temperature parts operate over this extended range, but with reduced performance. The

Extended temperature specs do not apply to Industrial temperature parts. In any case, the internal Junction

MCP60X

1µF

0.1 µF

MCP60X

1µF

0.1 µF