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BQ30Z554DBT-R1 数据表(PDF) 14 Page - Texas Instruments |
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BQ30Z554DBT-R1 数据表(HTML) 14 Page - Texas Instruments |
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14 / 29 page  bq30z554-R1 SLUSBD4 – OCTOBER 2013 www.ti.com ELECTRICAL CHARACTERISTICS: Internal Voltage Reference Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 3.8 V to 25 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VREF Internal Reference Voltage 1.215 1.225 1.230 V TA = –25 °C to 85 °C ±80 PPM/°C VREF_DRIFT Internal Reference Voltage Drift TA = 0 °C to 60 °C ±50 PPM/°C ELECTRICAL CHARACTERISTICS: Flash Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 3.8 V to 25 V (unless otherwise noted) PARAMETER(1) TEST CONDITIONS MIN TYP MAX UNIT Data retention 10 Years Data Flash 20k Cycles Flash programming write-cycles Instruction Flash 1k Cycles ICC(PROG_DF) Data Flash-write supply current TA = –40°C to 85°C 3 4 mA ICC(ERASE_DF) Data Flash-erase supply current TA = –40°C to 85°C 3 18 mA (1) Assured by design. Not production tested. ELECTRICAL CHARACTERISTICS: OCD Current Protection Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 3.8 V to 25 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RSNS = 0 50 200 mV OCD detection threshold voltage V(OCD) range, typical RSNS = 1 25 100 mV RSNS = 0 10 mV OCD detection threshold voltage ΔV(OCDT) program step RSNS = 1 5 mV V(OFFSET) OCD offset –10 10 mV V(Scale_Err) OCD scale error –10 10 % t(OCDD) Overcurrent in Discharge Delay 1 31 ms t(OCDD_STEP) OCDD Step options 2 ms VSRP – SRN = VTHRESH + t(DETECT) Current fault detect time 160 µs 12.5 mV Overcurrent and Short Circuit tACC Accuracy of typical delay time –20 20 % delay time accuracy ELECTRICAL CHARACTERISTICS: SCD1 Current Protection Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 3.8 V to 25 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RSNS = 0 100 450 mV SCD1 detection threshold voltage V(SDC1) range, typical RSNS = 1 50 225 mV RSNS = 0 50 mV SCD1 detection threshold voltage ΔV(SCD1T) program step RSNS = 1 25 mV V(OFFSET) SCD1 offset –10 10 mV V(Scale_Err) SCD1 scale error –10 10 % AFE.STATE_CNTL[SCDDx2] = 0 0 915 µs t(SCD1D) Short Circuit in Discharge Delay AFE.STATE_CNTL[SCDDx2] = 1 0 1830 µs AFE.STATE_CNTL[SCDDx2] = 0 61 µs t(SCD1D_STEP) SCD1D Step options AFE.STATE_CNTL[SCDDx2] = 1 122 µs 14 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links :bq30z554-R1 |
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