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STM32F051K4 数据表(PDF) 44 Page - STMicroelectronics

部件名 STM32F051K4
功能描述  Low- and medium-density advanced ARM??based 32-bit MCU with 16 to 64 Kbytes Flash, timers, ADC, DAC and comm. interfaces
PDF  104 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32F051K4 数据表(HTML) 44 Page - STMicroelectronics

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STM32F051x
Electrical characteristics
Doc ID 022265 Rev 3
45/105
6.3.4
Embedded reference voltage
The parameters given in Table 24 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 20.
6.3.5
Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 11: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to CoreMark code.
VPVD5
PVD threshold 5
Rising edge
2.57
2.68
2.79
V
Falling edge
2.47
2.58
2.69
V
VPVD6
PVD threshold 6
Rising edge
2.66
2.78
2.9
V
Falling edge
2.56
2.68
2.8
V
VPVD7
PVD threshold 7
Rising edge
2.76
2.88
3
V
Falling edge
2.66
2.78
2.9
V
VPVDhyst
(2)
PVD hysteresis
-
100
-
mV
IDD(PVD)
PVD current consumption
-
0.15
0.26
µA
1.
Data based on characterization results only, not tested in production.
2.
Guaranteed by design, not tested in production.
Table 23.
Programmable voltage detector characteristics (continued)
Symbol
Parameter
Conditions
Min(1)
Typ
Max(1)
Unit
Table 24.
Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT Internal reference voltage
–40 °C < TA < +105 °C
1.16
1.2
1.25
V
–40 °C < TA < +85 °C
1.16
1.2
1.24(1)
1.
Data based on characterization results, not tested in production.
V
TS_vrefint
(2)
2.
Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when
reading the internal
reference voltage
-5.1
17.1(3)
3.
Guaranteed by design, not tested in production.
µs
VRERINT
Internal reference voltage
spread over the
temperature range
VDD = 3 V ±10 mV
-
-
10(3)
mV
TCoeff
Temperature coefficient
-
-
100(3)
ppm/°C



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