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54HSC 数据表(PDF) 4 Page - Dynex Semiconductor |
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54HSC 数据表(HTML) 4 Page - Dynex Semiconductor |
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4 / 10 page ![]() 54HSC/T630 4/10 Figure 3: Error Detection and Correction Using Two EDAC Units S1 S0 Function L H Start READ H H Latch data & flag errors H L Correct data & Output syndrome bits DC CHARACTERISTICS AND RATINGS Parameter Min Max Units Supply Voltage -0.5 7 V Input Voltage VSS-0.3 VDD+0.3 V Current Through Any Pin -20 +20 mA Operating Temperature -55 125 °C Storage Temperature -65 150 °C Note: Stresses above those listed may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these conditions, or at any other condition above those indicated in the operations section of this specification, is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 5: Absolute Maximum Ratings Subgroup Definition 1 Static characteristics specified in Table 6 at +25 °C 2 Static characteristics specified in Table 6 at +125 °C 3 Static characteristics specified in Table 6 at -55 °C 9 Switching characteristics specified in Table 7 at +25 °C 10 Switching characteristics specified in Table 7 at +125 °C 11 Switching characteristics specified in Table 7 at -55 °C DEFINITION OF SUBGROUPS |
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