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STC3115 数据表(PDF) 12 Page - STMicroelectronics |
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STC3115 数据表(HTML) 12 Page - STMicroelectronics |
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12 / 31 page ![]() Functional description STC3115 12/31 DocID023755 Rev 4 6.1.3 Internal temperature monitoring The chip temperature (close to the battery temperature) is measured using one conversion cycle of the A/D converter every 16 s. The conversion cycle takes 213 = 8192 clock cycles. Using the 32768 Hz internal clock, the conversion cycle time is 250 ms. Resolution is 1° C and range is -40 to +125 °C. The result is stored in the REG_TEMPERATURE register (see Table 12). 6.1.4 Current sensing Voltage drop across the sense resistor is integrated during a conversion period and input to the 14-bit sigma-delta A/D converter. Using the 32768 Hz internal clock, the conversion cycle time is 500 ms for a 14-bit resolution. The LSB value is 5.88 µV. The A/D converter output is in two’s complement format. When a conversion cycle is completed, the result is added to the Coulomb counter accumulator and the number of conversions is incremented in a 16-bit counter. The current register is updated only after the conversion closest to the voltage conversion (that is: once per 4-s measurement cycle). The result is stored in the REG_CURRENT register (see Table 12). |
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