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AD5259 数据表(PDF) 13 Page - Analog Devices |
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AD5259 数据表(HTML) 13 Page - Analog Devices |
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13 / 24 page ![]() Data Sheet AD5259 Rev. C | Page 13 of 24 TEST CIRCUITS Figure 32 through Figure 37 illustrate the test circuits that define the test conditions used in the product Specifications tables. VMS A W B DUT V+ V+ = VDD 1LSB = V+/2N Figure 32. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 33. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS2 VMS1 VW A W B DUT IW = VDD/RNOMINAL RW = [VMS1 – VMS2]/IW Figure 34. Test Circuit for Wiper Resistance ∆V MS% DUT ( ) A W B V+ ∆V DD% ∆V MS ∆V DD ∆V DD VA VMS V+ = VDD ± 10% PSRR (dB) = 20 LOG PSS (%/%) = Figure 35. Test Circuit for Power Supply Sensitivity (PSS, PSSR) +5V –5V W A +2.5V B VOUT OFFSET GND DUT AD8610 VIN Figure 36. Test Circuit for Gain vs. Frequency W B DUT ISW ISW RSW GND TO VDD CODE = 0x00 = 0.1V 0.1V Figure 37. Test Circuit for Common-Mode Leakage Current |
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