CPU165MU datasheet(8/8 Pages) IRF

8 / 8 page

C-740

CPU165MU

Vce

90% Ic

10% Vce

td(off)

5% Ic

t1+5µS

Vce ic dt

90% Vge

+Vge

∫

Eoff =

Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining

Eoff, td(off), tf

Same type

device as

D.U.T.

430µF

80%

of Vce

Fig.18a - Test Circuit for Measurement of

ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf

∫Vceiedt

5% Vce

Ipk

Vcc

10% Ic

Vce

DUT VOLTAGE

AND CURRENT

GATE VOLTAGE D.U.T.

+Vg

10% +Vg

90% Ic

td(on)

DIODE REVERSE

RECOVERY ENERGY

Eon =

∫

Erec =

Vd id dt

DIODE RECOVERY

WAVEFORMS

Vpk

10% Vcc

Irr

10% Irr

Vcc

trr

∫

Qrr =

trr

id dt

Fig. 18c - Test Waveforms for Circuit of Fig. 18a,

Defining Eon, td(on), tr

Fig. 18d - Test Waveforms for Circuit of Fig. 18a,

Defining Erec, trr, Qrr, Irr

Refer to Section D for the following:

Appendix D: Section D - page D-6

Fig. 18e - Macro Waveforms for Test Circuit of Fig. 18a

Fig. 19 - Clamped Inductive Load Test Circuit

Fig. 20 - Pulsed Collector Current Test Circuit

Package Outline 4 - IMS-1 Package (10 pins)

Section D - page D-13

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