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AN3324 数据表(PDF) 22 Page - STMicroelectronics

部件名 AN3324
功能描述  Implementing power-on self tests
PDF  37 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

AN3324 数据表(HTML) 22 Page - STMicroelectronics

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AN3324
Module software requirements for non applicative peripherals
Doc ID 18311 Rev 2
22/37
3.13
Power Management Unit (PMU)
Software has to run core voltage LVD and HVD hardware-assisted self-test after the boot.
The PMU provides (to the user) the software capability to check the run of the BIST
procedure, generating non-critical faults (NCFs) or critical faults (CF) conditions for the
FCCU module (see Table 2: Fault assertion conditions).
At each power-on, the self-test circuitry is able to detect a failure of one of the two voltage
detectors and to provide a non critical fault (NCF) to the FCCU (see Section 3.5: Fault
Collection and Control Unit (FCCU)).
Note:
The hardware-assisted self-tests are initiated through the SIL fields in the PMU Control
Register (PMUCTLR_CTRL). If the self-test passes, a Non-Critical Fault is triggered (see
Figure 8: PMU power-on self test flow). If the self-test fails, a PMUCTRL_IRQS and Critical
Fault are asserted.
The BIST execution is controlled by the PMUCTRL_CTRL[SILHT] field (see Figure 7: Built-
in self test flow).
Figure 7.
Built-in self test flow
Table 2.
Fault assertion conditions
Fault number
Signal
NCF[13]
LVD BIST ok in test mode
NCF[14]
HVD BIST ok in test mode
CF[21]
LVD/HVD BIST failure result in test mode
LVD
(SILHT = 00)
Write SILHT = 01
IDLE MODE
TEST MODE
(SILHT = 01)
HVD
TEST MODE
(SILHT = 10)
Write SILHT = 10
Automatically at the
end of test



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