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AS5147P-HTST 数据表(PDF) 28 Page - ams AG |
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AS5147P-HTST 数据表(HTML) 28 Page - ams AG |
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28 / 40 page ![]() Page 28 ams Datasheet Document Feedback [v1-01] 2015-May-12 AS5147P − Application Information The programming can either be performed in 5V operation using the internal LDO (1uF on regulator output pin), or in 3V Operation but using a supply voltage between 3.3V and 3.5V. 1. Power on cycle 2. Write the SETTINGS1 and SETTINGS2 registerswith the Custom settings for this application 3. Position the magnet at the desired zero position 4. Read out the measured angle from the ANGLE register 5. Write ANGLE [5:0] into the ZPOSL register and ANGLE [13:6] into the ZPOSM register 6. Read reg(0x0016) to reg(0x0019) → Read register step1 7. Comparison of written content (settings and angle) with content of read register step1 8. If point 7 is correct, enable OTP read / write by setting PROGEN = 1 in the PROG register 9. Start the OTP burn procedure by setting PROGOTP = 1 in the PROG register 10. Read the PROG register until it reads 0x0000 (Programming procedure complete) 11. Clear the memory content writing 0x00 in the whole non-volatile memory 12. Enable OTP read / write by setting PROGEN = 1 in the PROG register 13. Set the PROGVER = 1 to set the Guard band for the guard band test(1). 14. Refresh the non-volatile memory content with the OTP content by setting OTPREF = 1 15. Read reg(0x0016) to reg(0x0019) → Read register step2 16. Comparison of written content (settings and angle) with content of read register step2. Mandatory: guard band test 17. New power on cycle, if point 16 is correct. If point 16 fails, the test with the guard band test1 was not successful and the device is incorrectly programmed. A reprogramming is not allowed! 18. Read reg(0x0016) to reg(0x0019) → Read register step3 19. Comparision of written content (settings and angle) with content of read register step3. 20. If point 19 is correct, the programming was successful. If point 19 fails, device is incorrectly programmed. A reprogramming is not allowed 1. Guard band test: Restricted to temperature range: 25 °C ± 20 °C Right after the programming procedure (max. 1 hour with same Conditions 25°C ± 20 °C) Same VDD voltage The guard band test is only for the verification of the burned OTP fuses during the programming sequence. A use of the guard band in other cases is not allowed. |
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