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RPC564L60L5BOSY 数据表(PDF) 115 Page - STMicroelectronics

部件名 RPC564L60L5BOSY
功能描述  microcontroller for Aerospace and Defense, SIL3/ASILD safety applications
PDF  137 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

RPC564L60L5BOSY 数据表(HTML) 115 Page - STMicroelectronics

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RPC56EL60L5
Electrical characteristics
136
The reset sequences shown in Figure 15 and Figure 16 are triggered by functional reset
events. RESET is driven low during these two reset sequences only if the corresponding
functional reset source (which triggered the reset sequence) was enabled to drive RESET
low for the duration of the internal reset sequence(c).
3.19.3
Reset sequence trigger mapping
The following table shows the possible trigger events for the different reset sequences. It
specifies the reset sequence start conditions as well as the reset sequence end indications
that are the basis for the timing data provided in Table 30.
c.
See RGM_FBRE register for more details.
Table 31. Reset sequence trigger — reset sequence
Reset
Sequence
Trigger
Reset
Sequence
Start
Condition
Reset
Sequence
End
Indication
Reset Sequence
Destructive
Reset
Sequence,
BIST
enabled(1)
Destructive
Reset
Sequence,
BIST
disabled(1)
External
Reset
Sequence
Long, BIST
enabled
Functional
Reset
Sequence
Long
Functional
Reset
Sequence
Short
All internal
destructive reset
sources
(LVDs or internal
HVD during
power-up and
during operation)
Destructive
reset
Release of
RESET(2)
triggers
cannot
trigger
cannot
trigger
cannot
trigger
Assertion of
RESET(3)
External
reset via
RESET
cannot trigger
triggers(4)
triggers(5)
triggers(6)
All internal
functional reset
sources
configured for
long reset
Sequence
starts with
internal reset
trigger
Release of
RESET(7)
cannot trigger
cannot
trigger
triggers
cannot
trigger
All internal
functional reset
sources
configured for
short reset
cannot trigger
cannot
trigger
cannot
trigger
triggers
1.
Whether BIST is executed or not depends on the chip configuration data stored in the shadow sector of the NVM.
2.
End of the internal reset sequence (as specified in Table 30) can only be observed by release of RESET if it is not held low
externally beyond the end of the internal sequence which would prolong the internal reset PHASE3 till RESET is released
externally.
3.
The assertion of RESET can only trigger a reset sequence if the device was running (RESET released) before. RESET
does not gate a Destructive Reset Sequence, BIST enabled or a Destructive Reset Sequence, BIST disabled. However, it
can prolong these sequences if RESET is held low externally beyond the end of the internal sequence (beyond PHASE3).
4.
If RESET is configured for long reset (default) and if BIST is enabled via chip configuration data stored in the shadow sector
of the NVM.
5.
If RESET is configured for long reset (default) and if BIST is disabled via chip configuration data stored in the shadow
sector of the NVM.



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