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RPC564L60L5BOSY 数据表(PDF) 115 Page - STMicroelectronics |
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RPC564L60L5BOSY 数据表(HTML) 115 Page - STMicroelectronics |
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115 / 137 page ![]() DocID026934 Rev 1 115/137 RPC56EL60L5 Electrical characteristics 136 The reset sequences shown in Figure 15 and Figure 16 are triggered by functional reset events. RESET is driven low during these two reset sequences only if the corresponding functional reset source (which triggered the reset sequence) was enabled to drive RESET low for the duration of the internal reset sequence(c). 3.19.3 Reset sequence trigger mapping The following table shows the possible trigger events for the different reset sequences. It specifies the reset sequence start conditions as well as the reset sequence end indications that are the basis for the timing data provided in Table 30. c. See RGM_FBRE register for more details. Table 31. Reset sequence trigger — reset sequence Reset Sequence Trigger Reset Sequence Start Condition Reset Sequence End Indication Reset Sequence Destructive Reset Sequence, BIST enabled(1) Destructive Reset Sequence, BIST disabled(1) External Reset Sequence Long, BIST enabled Functional Reset Sequence Long Functional Reset Sequence Short All internal destructive reset sources (LVDs or internal HVD during power-up and during operation) Destructive reset Release of RESET(2) triggers cannot trigger cannot trigger cannot trigger Assertion of RESET(3) External reset via RESET cannot trigger triggers(4) triggers(5) triggers(6) All internal functional reset sources configured for long reset Sequence starts with internal reset trigger Release of RESET(7) cannot trigger cannot trigger triggers cannot trigger All internal functional reset sources configured for short reset cannot trigger cannot trigger cannot trigger triggers 1. Whether BIST is executed or not depends on the chip configuration data stored in the shadow sector of the NVM. 2. End of the internal reset sequence (as specified in Table 30) can only be observed by release of RESET if it is not held low externally beyond the end of the internal sequence which would prolong the internal reset PHASE3 till RESET is released externally. 3. The assertion of RESET can only trigger a reset sequence if the device was running (RESET released) before. RESET does not gate a Destructive Reset Sequence, BIST enabled or a Destructive Reset Sequence, BIST disabled. However, it can prolong these sequences if RESET is held low externally beyond the end of the internal sequence (beyond PHASE3). 4. If RESET is configured for long reset (default) and if BIST is enabled via chip configuration data stored in the shadow sector of the NVM. 5. If RESET is configured for long reset (default) and if BIST is disabled via chip configuration data stored in the shadow sector of the NVM. |
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