STM32F401CB datasheet(111/134 Pages) STMICROELECTRONICS

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STM32F401xB STM32F401xC

Electrical characteristics

113

6.3.22

VBAT monitoring characteristics

6.3.23

Embedded reference voltage

The parameters given in Table 75 are derived from tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 14.

6.3.24

SD/SDIO MMC card host interface (SDIO) characteristics

Unless otherwise specified, the parameters given in Table 77 for the SDIO/MMC interface

are derived from tests performed under the ambient temperature, fPCLK2 frequency and VDD

supply voltage conditions summarized in Table 14, with the following configuration:

•

Output speed is set to OSPEEDRy[1:0] = 10

•

Capacitive load C = 30 pF

•

Measurement points are done at CMOS levels: 0.5VDD

Table 74. VBAT monitoring characteristics

Symbol

Parameter

Min

Typ

Max

Unit

Resistor bridge for VBAT

-50-

Ratio on VBAT measurement

Er(1)

Error on Q

–1

TS_vbat(2)(2)

ADC sampling time when reading the VBAT

1 mV accuracy

µs

1. Guaranteed by design.

2. Shortest sampling time can be determined in the application by multiple iterations.

Table 75. Embedded internal reference voltage

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VREFINT

Internal reference voltage

–40 °C < TA < +105 °C

1.18

1.21

1.24

TS_vrefint(1)

ADC sampling time when reading the

internal reference voltage

-10

µs

VRERINT_s(2)

Internal reference voltage spread over the

temperature range

VDD = 3V ± 10mV

TCoeff(2)

Temperature coefficient

ppm/°C

tSTART(2)

Startup time

µs

1. Shortest sampling time can be determined in the application by multiple iterations.

2. Guaranteed by design.

Table 76. Internal reference voltage calibration values

Symbol

Parameter

Memory address

VREFIN_CAL

Raw data acquired at temperature of

30 °C VDDA = 3.3 V

0x1FFF 7A2A - 0x1FFF 7A2B

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