UT54ACS191E datasheet(6/12 Pages) AEROFLEX

6 / 12 page

36-00-04-001

Ver. 1.0.0

Aeroflex Microelectronics Solutions - HiRel

Notes:

1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, -

50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are

guaranteed to VIH(min) and VIL(max).

2. Supplied as a design limit but not guaranteed or tested.

3. Per MIL-PRF-38535, for current density

≤ 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765

pF/MHz.

4. Not more than one output may be shorted at a time for maximum duration of one second.

5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at

frequency of 1MHz and a signal amplitude of 50mV rs maximum.

6. Maximum allowable relative shift equals 50mV.

7. For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25°C per MIL-STD-883 method 1019 condition

A up to the maximum TID level procured.

8. Power dissipation specified per switching output.

9. Power does not include power contribution of any TTL output sink current.

10. Guaranteed by characterization, but not tested.

CIN

Input capacitance 5

ƒ = 1MHz

VDD = 0V

COUT

Output capacitance 5

ƒ = 1MHz

VDD = 0V

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