Philips Semiconductors

Product data sheet

GTL2002

2-bit bi-directional low voltage translator

2004 Sep 29

6

Sizing pull-up resistor

The pull-up resistor value needs to limit the current through the pass transistor when it is in the “on” state to about 15 mA. This will guarantee a

pass voltage of 260 mV to 350 mV. If the current through the pass transistor is higher than 15 mA, the pass voltage will also be higher in the

“on” state. To set the current through each pass transistor at 15 mA, the pull-up resistor value is calculated as follows:

Resistor value (

W) +

Pull–up voltage (V)

*0.35 V

0.015 A

The table below summarizes resistor values for various reference voltages and currents at 15 mA and also at 10 mA and 3 mA. The resistor

value shown in the +10 % column or a larger value should be used to ensure that the pass voltage of the transistor would be 350 mV or less.

The external driver must be able to sink the total current from the resistors on both sides of the GTL–TVC device at 0.175 V, although the 15 mA

only applies to current flowing through the GTL–TVC device. See Application Note

AN10145-01 Bi-Directional Voltage Translators for more

information.

PULL-UP RESISTOR VALUES

PULL-UP RESISTOR VALUE (

Ω)

VOLTAGE

15 mA

10 mA

3 mA

VOLTAGE

NOMINAL

+ 10 %

NOMINAL

+ 10 %

NOMINAL

+ 10 %

5.0 V

310

341

465

512

1550

1705

3.3 V

197

217

295

325

983

1082

2.5 V

143

158

215

237

717

788

1.8 V

97

106

145

160

483

532

1.5 V

77

85

115

127

383

422

1.2 V

57

63

85

94

283

312

NOTES:

SYMBOL

PARAMETER

CONDITIONS

RATING

UNIT

DC source reference voltage

–0.5 to +7.0

V

DC drain reference voltage

–0.5 to +7.0

V

DC gate reference voltage

–0.5 to +7.0

V

–0.5 to +7.0

V

–0.5 to +7.0

V

DC diode current on reference pins

–50

mA

–50

mA

–50

mA

DC clamp current per channel

Channel in ON-state

±128

mA

Storage temperature range

–65 to +150

°C

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the

device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device reliability.

2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction

temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150

°C.

3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.