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M28W320ECT 数据表(PDF) 38 Page - STMicroelectronics |
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M28W320ECT 数据表(HTML) 38 Page - STMicroelectronics |
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38 / 53 page ![]() M28W320ECT, M28W320ECB 38/53 Table 28. CFI Query System Interface Information Offset Data Description Value 1Bh 0027h VDD Logic Supply Minimum Program/Erase or Write voltage bit 7 to 4 BCD value in volts bit 3 to 0 BCD value in 100 mV 2.7V 1Ch 0036h VDD Logic Supply Maximum Program/Erase or Write voltage bit 7 to 4 BCD value in volts bit 3 to 0 BCD value in 100 mV 3.6V 1Dh 00B4h VPP [Programming] Supply Minimum Program/Erase voltage bit 7 to 4 HEX value in volts bit 3 to 0 BCD value in 100 mV 11.4V 1Eh 00C6h VPP [Programming] Supply Maximum Program/Erase voltage bit 7 to 4 HEX value in volts bit 3 to 0 BCD value in 100 mV 12.6V 1Fh 0004h Typical time-out per single word program = 2n µs 16µs 20h 0004h Typical time-out for Double/ Quadruple Word Program = 2n µs 16µs 21h 000Ah Typical time-out per individual block erase = 2n ms 1s 22h 0000h Typical time-out for full chip erase = 2n ms NA 23h 0005h Maximum time-out for word program = 2n times typical 512µs 24h 0005h Maximum time-out for Double/ Quadruple Word Program = 2n times typical 512µs 25h 0003h Maximum time-out per individual block erase = 2n times typical 8s 26h 0000h Maximum time-out for chip erase = 2n times typical NA |
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