FLASH

AS29F010

Micross Components reserves the right to change products or specifications without notice.

14

AS29F010

Rev. 2.6 11/10

TABLE 6: TEST CONDITIONS,

Test Specifications

CONDITIONS

ALL SPEEDS

UNIT

Output Load

(including jig capacitance)

50

pF

Input Rise and Fall Times

5

ns

Input Pulse Levels

0/3

V

Input timing measurement

reference levels

1.5

V

Output timing measurement

reference levels

1.5

V

1 TTL Gate

AC CHARACTERISTICS: Read-Only Operations

FIGURE 7: TEST CONDITIONS,

Test Setup

JEDEC

Std

-50

-60

-70

90

-120

-150

Read Cycle Time

1

MIN

50607090

120

150

ns

Address to Output Delay

MAX

50

60

70

90

120

150

ns

Chip Enable to Output Delay

MAX

50

60

70

90

120

150

ns

Output Enable to Output Delay

MAX

25

30

35

40

50

55

ns

Chip Enable to Output High Z

1

MAX

15

20

20

25

30

35

ns

Output Enable to Output High Z

1

MAX

15

20

20

25

30

35

ns

Read

MIN

ns

Toggle and

Data Polling

MIN

ns

Output Hold Time From Addresses

CE\ or OE\, Whichever Occurs

First

MIN

ns

PARAMETER

TEST SETUP

Output Enable Hold Time

1

SYMBOL

UNITS

0

10

0

SPEED OPTIONS

NOTES:

1. Not 100% tested.

2. See Figure 7 and Table 6 for test specifications.