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AS29F040 数据表(PDF) 4 Page - Micross Components |
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AS29F040 数据表(HTML) 4 Page - Micross Components |
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4 / 27 page ![]() FLASH AS29F040 Micross Components reserves the right to change products or specifications without notice. 4 AS29F040 Rev. 2.3 01/10 DEVICE BUS OPERATIONS This section describes the requirements and use of the device bus operations, which are initiated through the inter- nal command register. The command register itself does not occupy any addressable memory location. The register is composed of latches that store the commands, along with the address and data information needed to execute the command. The contents of the register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. The appropriate device bus operations table lists the inputs and control levels required, and the resulting output. The following subsections describe each of these operations in further detail. Requirements for Reading Array Data To read array data from the outputs, the system must drive the CE\ and OE\ pins to V IL. CE\ is the power control and selects the device. OE\ is the output control and gates array data to the output pins. WE\ should remain at V IH. The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. The device remains en- abled for read access until the command register contents are altered. See “Reading Array Data” for more information. Refer to the AC Read Operations table for timing specifications and to the Read Operations Timings diagram for the timing wave- forms. I CC1 in the DC Characteristics table represents the active current specification for reading array data. TABLE 1: DEVICE BUS OPERATIONS NOTES: See the “Sector Protection/Unprotection” section for more information. Writing Commands/Command Sequences To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive WE\ and CE\ to V IL, and OE\ to VIH. An erase operation can erase one sector, multiple sectors, or the entire device. The Sector Address Tables indicate the address space that each sector occupies. A “sector address” con- sists of the address bits required to uniquely select a sector. See the “Command Definitions” section for details on erasing a sector or the entire chip, or suspending/resuming the erase operation. After the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on DQ7 - DQ0. Standard read cycle timings apply in this mode. Refer to the “Autoselect Mode” and “Autoselect Command Sequence” sections for more infor- mation. I CC2 in the DC Characteristics table represents the active current specification for the write mode. The “AC Char- acteristics” section contains timing specification tables and timing diagrams for write operations. Program and Erase Operation Status During an erase or program operation, the system may check the status of the operation by reading the status bits on DQ7 - DQ0. Standard read cycle timings and I CC read specifications apply. Refer to “Write Operation Status” for more information, and to each AC Characteristics section for timing diagrams. Standby Mode OPERATION CE\ OE\ WE\ A0 - A20 DQ0 - DQ7 Read L L H AIN DOUT Write L H L AIN DIN CMOS Standby VCC ± 0.5V X X X High-Z TTL Standby H X X X High-Z Output Disable L H H X High-Z |
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