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AS29F040 数据表(PDF) 15 Page - Micross Components |
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AS29F040 数据表(HTML) 15 Page - Micross Components |
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15 / 27 page ![]() FLASH AS29F040 Micross Components reserves the right to change products or specifications without notice. 15 AS29F040 Rev. 2.3 01/10 TABLE 6: TEST CONDITIONS, Test Specifications AC CHARACTERISTICS: Read-Only Operations FIGURE 7: TEST CONDITIONS, Test Setup NOTES: 1. See Figure 7 and Table 6 for test specifications. 2. Output driver disable time. 3. Not 100% tested. CONDITIONS -55 ALL OTHERS UNIT Output Load Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 20 ns Input Pulse Levels 0.0 - 3.0 0.45 - 2.4 V Input timing measurement reference levels 1.5 0.8, 2.0 V Output timing measurement reference levels 1.5 0.8, 2.0 V 1 TTL Gate JEDEC Std -55 -70 90 -120 -150 Read Cycle Time 3 tAVAV tRC MIN 55 70 90 120 150 ns Address to Output Delay tAVQV tACC CE\ = VIL OE\ = VIL MAX 55 70 90 120 150 ns Chip Enable to Output Delay tELQV tCE OE\ = VIL MAX 55 70 90 120 150 ns Output Enable to Output Delay tGLQV tOE MAX 30 30 35 50 55 ns Chip Enable to Output High Z 2, 3 tEHQZ tDF MAX 18 20 20 30 35 ns Output Enable to Output High Z 2, 3 tGHQZ tDF 18 20 20 30 35 ns Read MIN 00000 ns Toggle and Data Polling MIN 1010101010 ns Output Hold Time From Addresses CE\ or OE\, Whichever Occurs First tAXQX tOH MIN 00000 ns SPEED OPTIONS 1 UNITS PARAMETER TEST SETUP Output Enable Hold Time 3 tOEH SYMBOL |
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